parasitic BJT(기생 BJT; snapback, latch up) : 네이버 블로그
Snapback behavior determines ESD protection effectiveness - SemiWiki
Figure 4 from Snapback Breakdown Dynamics and ESD Susceptibility of LDMOS | Semantic Scholar
Figure 3 from Snapback Breakdown Dynamics and ESD Susceptibility of LDMOS | Semantic Scholar
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Figure 1 from Snapback Breakdown Dynamics and ESD Susceptibility of LDMOS | Semantic Scholar
Micromachines | Free Full-Text | A Snapback-Free and Low Turn-Off Loss 15 kV 4H–SiC IGBT with Multifunctional P-Floating Layer
Context-Aware SPICE Simulation Improves The Fidelity Of ESD Analysis
Impact from IC On-Chip Protection Design on EOS | EOS/ESD Association, Inc.
MODELING NMOS SNAPBACK CHARACTERISTIC USING PSPICE 1. Introduction 2. NMOS SNAPBACK
2 Snap-back I-V characteristic of common ESD device. | Download Scientific Diagram
Bipolar effects in snapback mechanism in advanced n-FET transistors under high current stress conditions
NMOS and PMOS breakdown characteristics. | Download Scientific Diagram
TVS Diodes | mbedded.ninja
Explain the snapback phenomenon in NMOS devices - Siliconvlsi
02 ESD basics_survey by Swetha | PPT
ESD Device Modeling: Part 1 - In Compliance Magazine
Your Mental Breakdown (v.2)
Junction temperature induced thermal snapback breakdown of MOSFET device | Semantic Scholar
Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology - ScienceDirect
parasitic BJT(기생 BJT; snapback, latch up) : 네이버 블로그
Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology - ScienceDirect
Typical snapback curve of gate-source diode of InP HEMT with pulse... | Download Scientific Diagram
Bipolar effects in snapback mechanism in advanced n-FET transistors under high current stress conditions
Bipolar effects in snapback mechanism in advanced n-FET transistors under high current stress conditions
What is the difference between Zener and snap-back behavior? - YouTube
반도체 공학 11-11 Snapback Breakdown - YouTube
The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness
